Dynamic Voltage Scaling with Fault-Tolerance for Lifetime Operation
نویسنده
چکیده
This work consists in a dynamic voltage scaling methodology, with Fault-Tolerance capability, to be used during circuits’ lifetime operation. Methodology implements on-line circuit monitoring, restricting power consumption by adjusting dynamically the power-supply voltage to the minimum value that prevent errors. Error free operation is achieved by using a cooperative work of global and local sensors, sensitive to PVT and Aging (namely, Bias Temperature Instability effects), and by adding an additional fault-tolerance margin to improve error avoidance. Spice simulations in a 65nm CMOS technology demonstrate the results for an example of a dynamic voltage scaling strategy. Keywords—Dynamic voltage scaling; Fault-Tolerance; Performance sensors; PVTA variations; Bias Temperature
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